Principles of Testing Electronic Systems (Record no. 597)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01538nam a2200253Ia 4500 |
| 001 - CONTROL NUMBER | |
| control field | 0002296 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20190326123425.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 170602s9999 xx 000 0 und d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9788126523061 |
| 028 ## - PUBLISHER NUMBER | |
| Qualifying information | 2016 |
| Source | Allied Informatics, Jaipur |
| 040 ## - CATALOGING SOURCE | |
| Language of cataloging | English |
| Original cataloging agency | BSDU |
| Transcribing agency | BSDU |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.381 548 |
| Item number | MOU |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Mourad, Samiha |
| 245 #0 - TITLE STATEMENT | |
| Title | Principles of Testing Electronic Systems |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 2nd |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Name of publisher, distributor, etc. | Wiley India Pvt. Ltd. India |
| Place of publication, distribution, etc. | New Delhi |
| Date of publication, distribution, etc. | 2015,c2000 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 420 |
| 500 ## - GENERAL NOTE | |
| General note | This is a textbook and professional reference in an important field of Integrated Circuit Design. The book emphasizes examples and practical applications. In response to reviews, the author provides more theory than is presently in the manuscript. This makes this book a serious competitor to the leading text by Abramovici |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc. note | Contents DESIGN AND TEST. · Overview of Testing. · Defects, Failures, and Faults. · Design Representation. · VLSI Design Flow. TEST FLOW. · Role of Simulation in Testing. · Automatic Test Pattern Generation. · Current Testing. DESIGN FOR TESTABILITY. · Ad Hoc Test Techniques. · Scan-Path Design. · Boundary-Scan Testing. · Built-in Self-Test. SPECIAL STRUCTURES. · Memory Testing. · Testing FPGAs and Microprocessors. · ADVANCED TOPICS. · Synthesis for Testability. · Testing SOCs. Appendices. Index. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Electronics |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Zorian, Yervant |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | |
| Koha item type | Books |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Permanent Location | Current Location | Date acquired | Cost, normal purchase price | Full call number | Barcode | Date last seen | Cost, replacement price | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| BSDU Knowledge Resource Center, Jaipur | BSDU Knowledge Resource Center, Jaipur | 2016-12-12 | 779.00 | 621.381 548 MOU | 002296 | 2020-02-12 | 779.00 | 2017-06-02 | Books | |||||
| BSDU Knowledge Resource Center, Jaipur | BSDU Knowledge Resource Center, Jaipur | 2016-12-12 | 779.00 | 621.381 548 MOU | 002297 | 2020-02-12 | 779.00 | 2017-06-02 | Books |