000			01538nam a2200253Ia 4500
999			_c597 _d597
001			0002296
003			OSt
005			20190326123425.0
008			170602s9999 xx 000 0 und d
020			_a9788126523061
028			_q2016 _bAllied Informatics, Jaipur
040			_bEnglish _aBSDU _cBSDU
082			_a621.381 548 _bMOU
100			_aMourad, Samiha
245		0	_aPrinciples of Testing Electronic Systems
250			_a2nd
260			_bWiley India Pvt. Ltd. India _a New Delhi _c2015,c2000
300			_a420
500			_aThis is a textbook and professional reference in an important field of Integrated Circuit Design. The book emphasizes examples and practical applications. In response to reviews, the author provides more theory than is presently in the manuscript. This makes this book a serious competitor to the leading text by Abramovici
504			_aContents DESIGN AND TEST. · Overview of Testing. · Defects, Failures, and Faults. · Design Representation. · VLSI Design Flow. TEST FLOW. · Role of Simulation in Testing. · Automatic Test Pattern Generation. · Current Testing. DESIGN FOR TESTABILITY. · Ad Hoc Test Techniques. · Scan-Path Design. · Boundary-Scan Testing. · Built-in Self-Test. SPECIAL STRUCTURES. · Memory Testing. · Testing FPGAs and Microprocessors. · ADVANCED TOPICS. · Synthesis for Testability. · Testing SOCs. Appendices. Index.
650			_aElectronics
700			_a Zorian, Yervant
942			_2ddc _cBK