Principles of Testing Electronic Systems
By: Mourad, Samiha.
Contributor(s): Zorian, Yervant.
Material type:
BookPublisher: New Delhi Wiley India Pvt. Ltd. India 2015,c2000Edition: 2nd.Description: 420.ISBN: 9788126523061.Subject(s): ElectronicsDDC classification: 621.381 548
| Item type | Current location | Call number | Status | Date due | Barcode |
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BSDU Knowledge Resource Center, Jaipur | 621.381 548 MOU (Browse shelf) | Available | 002296 | |
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Books
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BSDU Knowledge Resource Center, Jaipur | 621.381 548 MOU (Browse shelf) | Available | 002297 |
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| 621.381 537 2 RAO Switching Theory and Logic Design | 621.381 537 2 RAO Switching Theory and Logic Design | 621.381 537 2 RAO Switching Theory and Logic Design | 621.381 548 MOU Principles of Testing Electronic Systems | 621.381 548 MOU Principles of Testing Electronic Systems | 621.381 71 GHA VLSI Fabrication Principles : Silicon and Gallium Arsenide | 621.381 71 GHA VLSI Fabrication Principles : Silicon and Gallium Arsenide |
This is a textbook and professional reference in an important field of Integrated Circuit Design. The book emphasizes examples and practical applications. In response to reviews, the author provides more theory than is presently in the manuscript. This makes this book a serious competitor to the leading text by Abramovici
Contents
DESIGN AND TEST.
· Overview of Testing.
· Defects, Failures, and Faults.
· Design Representation.
· VLSI Design Flow.
TEST FLOW.
· Role of Simulation in Testing.
· Automatic Test Pattern Generation.
· Current Testing.
DESIGN FOR TESTABILITY.
· Ad Hoc Test Techniques.
· Scan-Path Design.
· Boundary-Scan Testing.
· Built-in Self-Test.
SPECIAL STRUCTURES.
· Memory Testing.
· Testing FPGAs and Microprocessors.
· ADVANCED TOPICS.
· Synthesis for Testability.
· Testing SOCs.
Appendices.
Index.
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